Name: 25.4mm Dia., 1mm Thick, 355nm, Nd:YAG Laser Line Beam Sampler
Brand: TECHSPEC
SKU: 29-019
Price: KRW 219,000

25.4mm Dia., 1mm Thick, 355nm, Nd:YAG Laser Line Beam Sampler

TECHSPEC® Thin Nd:YAG Laser Line Beam Samplers

재고 #29-019 신제품 3~5일내 배송

- +

KRW 219,000

수량 1-5
KRW 219,000

수량 6+
KRW 197,100

가격(부가세 별도)
견적 요청

+ 저장 목록에 추가하기
Create an account or log in to access saved list

제품 비교하기

제품 정보 다운로드

Angle of Incidence (°):

0 ±5

Coating:

Laser V-Coat (355nm)

Design Wavelength DWL (nm):

355

Diameter (mm):

25.40 +0.00/-0.10

Substrate: Many glass manufacturers offer the same material characteristics under different trade names. Learn More

Fused Silica (Corning 7980)

Index of Refraction n_d:

1.458

Surface Quality:

20-10

Thickness (mm):

1.00 ±0.10

Type:

Beam Sampler

Coating Specification:

R_abs <0.25% @ 355nm @ 0 ±5° AOI

Clear Aperture (%):

Parallelism (arcmin):

<0.50

Damage Threshold, By Design: Damage threshold for optical components varies by substrate material and coating. Click here to learn more about this specification.

7.5 J/cm² @ 355nm, 20ns, 20Hz

Transmitted Wavefront Distortion:

0.167 @ 632.8nm

Regulatory Compliance

RoHS:

규격준수

Certificate of Conformance:

보기

제품군의 상세 설명

Thin 1mm Design for Space and Weight Constrained Applications
Uncoated First Surface Provides Fresnel Reflection
AR Coated Second Surface Provides High Transmission
High Laser Damage Threshold to Prevent Laser Ablation

TECHSPEC® Thin Nd:YAG Laser Line Beam Samplers are designed to isolate a small portion of incident beams via Fresnel reflection and anti-reflection properties for beam monitoring purposes. These beam samplers are designed with a 1mm thickness to facilitate applications where space and weight constraints are critical. Additionally, an anti-reflection (AR) coating with a high damage threshold on surface two maximizes transmission and reduces ghost reflections. These second surface coated beam samplers are available in laser line coatings including 266nm, 355nm, 532nm, and 1064nm wavelengths. TECHSPEC® Thin Nd:YAG Laser Line Beam Samplers feature a UV Fused Silica substrate which provides excellent transmission from the UV to the IR and a low coefficient of thermal expansion. These beam samplers are ideal for applications where monitoring beam power, wavefront distortion, and optical losses are required.

Note: TECHSPEC® Thin Nd:YAG Laser Line Beam Samplers can be used with Laser Measurement products to monitor beam properties, such as beam power and beam profile, in real time.